Items where School is "School of Computing Sciences

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Number of items: 11.

Published

Dawson, C., Scott, A., Bangham, Andrew and Croghan, P (1985) The relationship between potassium and insulin release from normal and ob/ob (Norwich colony) mice. Diabetic Medicine, 2. 327A. ISSN 0742-3071

Dowsing, R. D. (1985) Simulating hardware structures in occam. IEE Software and Microsystems, 4 (4). pp. 77-84. ISSN 0261-3182

Dowsing, R. D. and Gostling, S. M. (1985) Using a binary decision controller. IEE Software and Microsystems, 4 (5). pp. 133-144. ISSN 0261-3182

Glauert, J. R. W., Gurd, J. R. and Kirkham, C. C. (1985) Evolution of a Dataflow Architecture. In: Concurrent Languages in Distributed Systems: Hardware Supported Implementation. Elsevier, pp. 1-18. ISBN 9780444876355

Jacob, T, Bangham, Andrew and Duncan, G (1985) Characterizing of cation channel on the apical surface of the frog lens epithelium. Quarterly Journal of Experimental Physiology, 70 (3). pp. 403-421. ISSN 0144-8757

Kulinskaya, Elena (1985) A consistent estimate for a scale parameter. Theory of Probability & its Applications, 29 (4). pp. 798-803. ISSN 0040-585X

Obaid, A. A. S., Maclean, T. S. M. and Razaz, M. (1985) Propagation characteristics of rectangular corrugated waveguides. IEE Proceedings H: Microwaves Antennas and Propagation, 132 (7). pp. 413-418. ISSN 0950-107X

Razaz, M. and Quigly, S. (1985) A two dimensional finite element dynamic simulator for semiconductor devices. In: 4th International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits, 1985-06-19 - 1985-06-21, Trinity College.

de Cogan, D. and Alani, A. (1985) Double-resonance technique for C/V measurements of semiconductor devices. IEE Electronics Letters, 21 (24). pp. 1153-1154. ISSN 0013-5194

de Cogan, D., Howe, A. F. and Webb, P. W. (1985) Temperature measurements of thin films on substrates. IEE Proceedings I: Solid-State and Electron Devices, 132 (3). pp. 143-146. ISSN 0143-7100

de Cogan, D. and John, S. A. (1985) Computer-aided thermal analysis of reverse-biased PIN diodes. IEE Proceedings I: Solid-State and Electron Devices, 132 (3). p. 170. ISSN 0143-7100

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