Temperature Measurements of Thin Films on Substrates

de Cogan, D., Howe, A. F. and Webb, P. W. (1985) Temperature Measurements of Thin Films on Substrates. IEE Proceedings I: Solid-State and Electron Devices, 132 (3). pp. 143-146. ISSN 0143-7100

Full text not available from this repository.

Abstract

Thin-film fuses consisting of single layers of silver have been deposited on silica and alumina substrates. Results of temperature measurements are presented for the case where the fuse current is significantly below the level necessary for metal vaporisation and arc formation.

Item Type: Article
Faculty \ School: Faculty of Science > School of Computing Sciences
Related URLs:
Depositing User: Vishal Gautam
Date Deposited: 08 Mar 2011 09:33
Last Modified: 17 Oct 2019 10:30
URI: https://ueaeprints.uea.ac.uk/id/eprint/22463
DOI: 10.1049/ip-i-1.1985.0029

Actions (login required)

View Item View Item