Temperature measurements of thin films on substrates

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de Cogan, D., Howe, A. F. and Webb, P. W. (1985) Temperature measurements of thin films on substrates. IEE Proceedings I: Solid-State and Electron Devices, 132 (3). pp. 143-146. ISSN 0143-7100

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Abstract

Thin-film fuses consisting of single layers of silver have been deposited on silica and alumina substrates. Results of temperature measurements are presented for the case where the fuse current is significantly below the level necessary for metal vaporisation and arc formation.

Item Type:	Article
Faculty \ School:	Faculty of Science > School of Computing Sciences
Related URLs:	http://ieeexplore.ieee.org/xpl/freeabs_a...
Depositing User:	Vishal Gautam
Date Deposited:	08 Mar 2011 09:33
Last Modified:	04 Mar 2024 16:49
URI:	https://ueaeprints.uea.ac.uk/id/eprint/22463
DOI:	10.1049/ip-i-1.1985.0029

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