Double-resonance technique for C/V measurements of semiconductor devices

de Cogan, D. and Alani, A. (1985) Double-resonance technique for C/V measurements of semiconductor devices. IEE Electronics Letters, 21 (24). pp. 1153-1292. ISSN 0013-5194

Full text not available from this repository.
Item Type: Article
Faculty \ School: Faculty of Science > School of Computing Sciences
Related URLs:
Depositing User: EPrints Services
Date Deposited: 01 Oct 2010 13:41
Last Modified: 21 Apr 2020 21:42
URI: https://ueaeprints.uea.ac.uk/id/eprint/3085
DOI: 10.1049/el:19850816

Actions (login required)

View Item View Item