Generation of surface plasmon resonance and lossy mode resonance by thermal treatment of ITO thin-films

Del Villar, I., Zamarreño, C. R., Hernaez, M. ORCID: https://orcid.org/0000-0001-7878-4704, Sanchez, P., Arregui, F. J. and Matias, I. R. (2015) Generation of surface plasmon resonance and lossy mode resonance by thermal treatment of ITO thin-films. Optics and Laser Technology, 69. pp. 1-7. ISSN 0030-3992

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Abstract

Silicon wafers coated with Indium Tin Oxide (ITO) by application of sputtering technique have been characterized after different post-annealing techniques, showing that this last factor is critical for the quality of the thin-film and for the creation and tuning of both surface plasmon resonances and lossy mode resonances. By adequate selection of the ITO thin-film thickness both resonances can be tracked in the same spectrum, which can be used in sensor and optical communications fields.

Item Type: Article
Uncontrolled Keywords: optical resonance,sensors,thin films,electronic, optical and magnetic materials,atomic and molecular physics, and optics,electrical and electronic engineering ,/dk/atira/pure/subjectarea/asjc/2500/2504
Faculty \ School: Faculty of Science > School of Chemistry (former - to 2024)
UEA Research Groups: Faculty of Science > Research Groups > Materials, Manufacturing & Process Modelling
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Depositing User: LivePure Connector
Date Deposited: 09 Apr 2020 00:50
Last Modified: 07 Nov 2024 12:42
URI: https://ueaeprints.uea.ac.uk/id/eprint/74739
DOI: 10.1016/j.optlastec.2014.12.012

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