Lv, Y., Lee, C. K. M., Chan, H. K. and Ip, W. H. (2012) RFID-based colored Petri net applied for quality monitoring in manufacturing system. International Journal of Advanced Manufacturing Technology, 60 (1-4). pp. 225-236. ISSN 1433-3015
Full text not available from this repository.Item Type: | Article |
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Uncontrolled Keywords: | colored petri net modeling,manufacturing process,process quality control,product quality monitoring,real-time analysis,rfid |
Faculty \ School: | Faculty of Social Sciences > Norwich Business School |
UEA Research Groups: | Faculty of Social Sciences > Research Groups > Innovation, Technology and Operations Management |
Depositing User: | Hing Kai Chan |
Date Deposited: | 07 Aug 2012 09:15 |
Last Modified: | 23 Oct 2022 00:21 |
URI: | https://ueaeprints.uea.ac.uk/id/eprint/39264 |
DOI: | 10.1007/s00170-011-3568-z |
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