Model Based Test Generation for Processor Verification

Lichtenstein, Yossi, Malka, Yossi and Aharon, Aharon (1994) Model Based Test Generation for Processor Verification. In: Proceedings of the American Association of AI's 6th Innovative Applications of Artificial Intelligence Conference (IAAI), 1994-08-01.

Full text not available from this repository.

Abstract

A few simple Expert-System techniques have been invaluable in developing a new test program generator for design verification of hardware processors. The new generator uses a formal declarative model of the processor architecture; it allows generation of test programs for a variety of processors without duplication of effort.

Item Type:	Conference or Workshop Item (Paper)
Faculty \ School:	Faculty of Social Sciences > Norwich Business School
Depositing User:	Elle Green
Date Deposited:	06 Jul 2012 09:46
Last Modified:	23 Oct 2022 23:48
URI:	https://ueaeprints.uea.ac.uk/id/eprint/39099
DOI:

Actions (login required)

View Item