Modelling PSF of Scanning Electron Microscopes for Image Restoration

Swindells, J., Razaz, M. and Tovey, K. (1998) Modelling PSF of Scanning Electron Microscopes for Image Restoration. In: Proceedings of the European Signal Processing Conference (EUSIPCO '98), 1998-09-08 - 1998-09-11.

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Item Type: Conference or Workshop Item (Other)
Faculty \ School: Faculty of Science > School of Computing Sciences
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Depositing User: EPrints Services
Date Deposited: 01 Oct 2010 13:42
Last Modified: 01 May 2020 00:14
URI: https://ueaeprints.uea.ac.uk/id/eprint/3810
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