Modelling PSF of Scanning Electron Microscopes for Image Restoration

Swindells, J., Razaz, M. and Tovey, K. (1998) Modelling PSF of Scanning Electron Microscopes for Image Restoration. In: European Signal Processing Conference, 1998-09-08 - 1998-09-11.

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Item Type:	Conference or Workshop Item (Other)
Faculty \ School:	Faculty of Science > School of Computing Sciences
Depositing User:	EPrints Services
Date Deposited:	01 Oct 2010 13:42
Last Modified:	15 Dec 2022 01:08
URI:	https://ueaeprints.uea.ac.uk/id/eprint/3810
DOI:

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