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Full text not available from this repository.Abstract
Transmission Line Matrix (TLM) is a numerical technique which can be used to simulate wide range of physical process. In the area of semiconductor device modeling the correct choice of electromagnetic analogue can have a strong influence on the stability, accuracy and efficiency of algorithms. This paper reviews recent progress in TLM with particular attention to the drift-diffusion process in carrier transport in semiconductors.
Item Type: | Conference or Workshop Item (Other) |
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Faculty \ School: | Faculty of Science > School of Computing Sciences |
Depositing User: | EPrints Services |
Date Deposited: | 01 Oct 2010 13:41 |
Last Modified: | 24 Sep 2024 07:17 |
URI: | https://ueaeprints.uea.ac.uk/id/eprint/3077 |
DOI: | 10.1117/12.276238 |
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