How to measure patent thickets--A novel approach

Von Graevenitz, Georg, Wagner, Stefan and Harhoff, Dietmar (2011) How to measure patent thickets--A novel approach. Economics Letters, 111 (1). pp. 6-9.

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Abstract

The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.

Item Type: Article
Faculty \ School: Faculty of Social Sciences > Norwich Business School
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Depositing User: Georg Von Graevenitz
Date Deposited: 03 Feb 2012 13:35
Last Modified: 21 Jul 2020 23:30
URI: https://ueaeprints.uea.ac.uk/id/eprint/36831
DOI:

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