Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM
Tools
Bangert, U, Gass, M, Siller, L, Coxon, PR, Chao, Y and Horrocks, BR (2008) Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM. Journal of Physics: Conference Series, 126. 012066. ISSN 1742-6588
![]()
|
PDF (Yimin11jpconf2008.pdf)
Download (612kB) | Preview |
Item Type: | Article |
---|---|
Faculty \ School: | Faculty of Science > School of Chemistry |
Related URLs: | |
Depositing User: | Yimin Chao |
Date Deposited: | 13 Jan 2012 22:47 |
Last Modified: | 27 Jul 2020 23:31 |
URI: | https://ueaeprints.uea.ac.uk/id/eprint/35249 |
DOI: | 10.1088/1742-6596/126/1/012066 |
Actions (login required)
![]() |
View Item |