Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM

Bangert, U, Gass, M, Siller, L, Coxon, PR, Chao, Y and Horrocks, BR (2008) Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM. Journal of Physics: Conference Series, 126. 012066. ISSN 1742-6588

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Item Type: Article
Faculty \ School: Faculty of Science > School of Chemistry
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Depositing User: Yimin Chao
Date Deposited: 13 Jan 2012 22:47
Last Modified: 21 Apr 2020 17:56
URI: https://ueaeprints.uea.ac.uk/id/eprint/35249
DOI: 10.1088/1742-6596/126/1/012066

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