Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM
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ToolsBangert, U, Gass, M, Siller, L, Coxon, PR, Chao, Y and Horrocks, BR (2008) Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM. Journal of Physics: Conference Series, 126. 012066. ISSN 1742-6588
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| Item Type: | Article |
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| Faculty \ School: | Faculty of Science > School of Chemistry |
| Related URLs: | |
| Depositing User: | Yimin Chao |
| Date Deposited: | 13 Jan 2012 22:47 |
| Last Modified: | 21 Apr 2020 17:56 |
| URI: | https://ueaeprints.uea.ac.uk/id/eprint/35249 |
| DOI: | 10.1088/1742-6596/126/1/012066 |
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