Transmission-line matrix models for solving transient problems of diffusion with recombination

Gui, X. and de Cogan, D. (2003) Transmission-line matrix models for solving transient problems of diffusion with recombination. International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, 16 (5). pp. 453-464. ISSN 0894-3370

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Abstract

Starting from the general telegrapher's equation, we investigate two nodal network constructions for modelling diffusion with recombination by means of the transmission-line matrix (TLM) method. The diffusion effect is modelled by the series and shunt capacitance in one approach, and by the series inductance and shunt resistance in the other. Both approaches use the series and shunt resistances to model the recombination effect. The constraint of using both TLM networks for solving transient problems of diffusion with recombination is found to be identical in terms of the physics behind the numerical routines. A practical way of determining the spatial resolution and iteration time step for accurate TLM numerical computations is suggested based on a simple frequency analysis.

Item Type: Article
Faculty \ School: Faculty of Science > School of Computing Sciences
Related URLs:
Depositing User: Vishal Gautam
Date Deposited: 22 Jul 2011 20:13
Last Modified: 17 Mar 2020 17:29
URI: https://ueaeprints.uea.ac.uk/id/eprint/23279
DOI: 10.1002/jnm.511

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