Modelling PSF of Scanning Electron Microscopes for Image Restoration

Swindells, J., Razaz, M. and Tovey, K. (1998) Modelling PSF of Scanning Electron Microscopes for Image Restoration. In: Proceedings of the European Signal Processing Conference (EUSIPCO '98), 1998-09-08 - 1998-09-11.

Full text not available from this repository.
Item Type: Conference or Workshop Item (Other)
Faculty \ School: Faculty of Science > School of Computing Sciences
Related URLs:
Depositing User: EPrints Services
Date Deposited: 01 Oct 2010 14:42
Last Modified: 25 Jul 2018 02:03
URI: https://ueaeprints.uea.ac.uk/id/eprint/3810
DOI:

Actions (login required)

View Item