How to measure patent thickets--A novel approach

Von Graevenitz, Georg, Wagner, Stefan and Harhoff, Dietmar (2011) How to measure patent thickets--A novel approach. Economics Letters, 111 (1). pp. 6-9.

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    Abstract

    The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.

    Item Type: Article
    Faculty \ School: Faculty of Social Sciences > Norwich Business School
    ?? NBS-LON ??
    University of East Anglia > Faculty of Social Sciences > Research Groups > Business Regulation
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    Depositing User: Georg Von Graevenitz
    Date Deposited: 03 Feb 2012 13:35
    Last Modified: 25 Jul 2018 03:46
    URI: https://ueaeprints.uea.ac.uk/id/eprint/36831
    DOI:

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