How to measure patent thickets--A novel approach

Von Graevenitz, Georg, Wagner, Stefan and Harhoff, Dietmar (2011) How to measure patent thickets--A novel approach. Economics Letters, 111 (1). pp. 6-9.

This is the latest version of this item.

[img] PDF (eletters_hwvg.pdf)
Download (686kB)


    The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.

    Item Type: Article
    Faculty \ School: Faculty of Social Sciences > Norwich Business School
    ?? NBS-LON ??
    Related URLs:
    Depositing User: Georg Von Graevenitz
    Date Deposited: 03 Feb 2012 13:35
    Last Modified: 21 Mar 2019 12:55

    Available Versions of this Item

    Actions (login required)

    View Item