Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM

Bangert, U, Gass, M, Siller, L, Coxon, PR, Chao, Y and Horrocks, BR (2008) Intact sublimation of silicon nanocrystals evidenced via HREM imaging and EELS in a dedicated STEM. Journal of Physics: Conference Series, 126. 012066. ISSN 1742-6588

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    Item Type: Article
    Faculty \ School: Faculty of Science > School of Chemistry
    Related URLs:
    Depositing User: Yimin Chao
    Date Deposited: 13 Jan 2012 22:47
    Last Modified: 15 Nov 2018 17:30
    URI: https://ueaeprints.uea.ac.uk/id/eprint/35249
    DOI: 10.1088/1742-6596/126/1/012066

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