Electron energy loss spectroscopy on alkylated silicon nanocrystals

Coxon, Paul R., Chao, Yimin, Horrocks, Benjamin R., Gass, Mhairi, Bangert, Ursel and Šiller, Lidija (2008) Electron energy loss spectroscopy on alkylated silicon nanocrystals. Journal of Applied Physics, 104 (8). 084318. ISSN 1089-7550

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Abstract

Alkyl-passivated silicon nanoparticles have been studied via aberration-corrected scanning transmission electron microscopy (STEM) in conjunction with electron energy loss spectroscopy in order to characterize both their chemical composition and structural make-up. Energy loss spectra indicate a predominantly silicon core structure with some oxide species and Si–C surface bonds. Shifts in the Si?L-edge onset to higher energies are attributed to quantum confinement effects in the material although the magnitudes are greater than theoretical values expected for silicon nanocrystals bound by alkyl chains. Nanocrystal STEM samples formed by direct evaporation and deposition of intact nanocrystals show evidence of crystalline planes and structural rearrangements, which can be observed under extended irradiation by the electron probe beam.

Item Type: Article
Faculty \ School: Faculty of Science > School of Chemistry
University of East Anglia > Faculty of Science > Research Groups > Physical and Analytical Chemistry
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Depositing User: Rachel Smith
Date Deposited: 21 Mar 2011 12:14
Last Modified: 25 Jul 2018 05:07
URI: https://ueaeprints.uea.ac.uk/id/eprint/26764
DOI: 10.1063/1.3000566

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